Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate

For more detailed information on FSM, please visit the FSM website