Welcome to Frontier Semiconductor

Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate


  • Optical Measurement Techniques
  • Electrical Measurement Techniques
  • Material Characterization
  • Process Tools


  • Thin Film Stress
  • Raman Spectroscopy     Principle
  • Thermal Stress Analysis     Concept
For more detailed information on FSM, please visit the FSM website


Copyright © 2007-2015 - Top of Page - Sitemap - Extranet