FSM

Welcome to Frontier Semiconductor

Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate

Products

  • Optical Measurement Techniques
  • Electrical Measurement Techniques
  • Material Characterization
  • Process Tools

Applications

  • Thin Film Stress
  • Raman Spectroscopy     Principle
  • Thermal Stress Analysis     Concept
 
For more detailed information on FSM, please visit the FSM website

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