IOSS

WID110 wafer reader

Advanced performance in wafer identification

The WID110 Wafer-ID Reader is specifically designed to meet the requirements of the semiconductor industry. A new innovative multi-spectral illumination concept permits dependable identification at every production step. Software algorithms proven in practice ensure very high decoding rates, even on codes, affected by process effects like coating, edge beads, CMP etc.

  • Fast and reliable decoding of direct marked wafer codes

  • Easy integration into any tool

  • Graphical user interface for easy set-up

  • Multi-spectral, multi-channel lighting, Innovating lighting red/green/blue LED

  • Ethernet, RS232-Interface, trigger input

  • Field-proven decoding algorithms

  • Very compact design

  • Flexible mounting-system

  • Robust aluminum housing, black anodized

The SD100 touch panel

Advanced performance in wafer identification

The status and scanning results can be managed using a red-green "traffic light" indicator in a list view. By simply touching the screen you can start the correct software for each scanning system. Live images indicate whether the system is optimally configured.

  • Online monitoring

  • Live image display

  • Logging of results and images

  • Remote mode

  • Manually trigger mode

  • Error messaging by e-mail

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